TEST_NAME : Wafer
TEST_DATE : 24_08_28-20_13_11
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-015-005-017-13 | FUSED_ID : 6359364768388632861
  IC_TEMP :  -56.29 | VDDM : 1120.21 | AUX_INT :   -8.52 | CsaBias :   76.17
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.24429e-03 / 2
  ADC_P0  : -8.51622e-03 ± 2.39250e-02
  ADC_P1  : 8.52246e-03 ± 6.04937e-04
  ADC_P2  : -5.42071e-06 ± 3.04572e-06
  CSA_Chi2/NDF : 1.38737e-04 / 2
  CSA_P0  : 5.96510e-02 ± 7.85632e-03
  CSA_P1  : 1.03462e-02 ± 5.91917e-04
  CSA_P2  : -5.54625e-05 ± 9.01420e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [2, 9, 34, 67, 116]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  5
 | P_BROKEN_FAST :  [45, 82, 84, 97, 108]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.4375', '1.800', '0.1526', '1.799', '0.0967', '7.000', '0.7081', 1, 1, 1, 1, 1724868791.1302276]
VI_after__Init : ['1.201', '0.4379', '1.800', '0.1526', '1.800', '0.0891', '7.000', '0.7071', 1, 1, 1, 1, 1724868799.4036832]
VI_at__the_End : ['1.201', '0.4868', '1.800', '0.1365', '1.801', '0.1141', '7.000', '0.7080', 1, 1, 1, 1, 1724868860.1880171]