TEST_NAME : Wafer
TEST_DATE : 24_08_28-20_11_35
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-015-005-018-13 | FUSED_ID : 6359364768388632877
  IC_TEMP :  -62.02 | VDDM : 1126.93 | AUX_INT :   -8.50 | CsaBias :   66.70
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.28857e-03 / 2
  ADC_P0  : -8.49501e-03 ± 2.43230e-02
  ADC_P1  : 8.40742e-03 ± 5.98281e-04
  ADC_P2  : -5.88121e-06 ± 2.91751e-06
  CSA_Chi2/NDF : 1.23980e-04 / 2
  CSA_P0  : 5.84177e-02 ± 7.42673e-03
  CSA_P1  : 9.55586e-03 ± 5.59551e-04
  CSA_P2  : -4.58322e-05 ± 8.52129e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  3
 | N_BROKEN_FAST :  [4, 26, 48]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  9
 | P_BROKEN_FAST :  [38, 47, 63, 71, 91, 93, 98, 112, 124]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2707', '1.800', '0.1490', '1.799', '0.0941', '7.000', '0.7071', 1, 1, 1, 1, 1724868694.5257661]
VI_after__Init : ['1.202', '0.2708', '1.800', '0.1491', '1.800', '0.0884', '7.000', '0.7071', 1, 1, 1, 1, 1724868703.3621333]
VI_at__the_End : ['1.202', '0.4725', '1.800', '0.1376', '1.799', '0.1147', '7.000', '0.7079', 1, 1, 1, 1, 1724868762.5674274]