TEST_NAME : Wafer
TEST_DATE : 24_08_28-20_06_46
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-015-005-021-13 | FUSED_ID : 6359364768388632925
  IC_TEMP :  -60.31 | VDDM : 1127.69 | AUX_INT :   -8.41 | CsaBias :   59.50
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.20159e-03 / 2
  ADC_P0  : -8.41454e-03 ± 2.35109e-02
  ADC_P1  : 8.53376e-03 ± 5.94465e-04
  ADC_P2  : -5.47737e-06 ± 2.99299e-06
  CSA_Chi2/NDF : 2.01304e-04 / 2
  CSA_P0  : 5.92030e-02 ± 9.46344e-03
  CSA_P1  : 1.03598e-02 ± 7.13002e-04
  CSA_P2  : -5.54516e-05 ± 1.08582e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  8
 | N_BROKEN_FAST :  [23, 45, 46, 53, 73, 91, 103, 116]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  9
 | P_BROKEN_FAST :  [2, 3, 19, 26, 51, 76, 80, 81, 119]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.1496', '1.800', '0.1646', '1.800', '0.0833', '7.000', '0.7076', 1, 1, 1, 1, 1724868406.2338026]
VI_after__Init : ['1.202', '0.1497', '1.800', '0.1646', '1.800', '0.0760', '7.000', '0.7069', 1, 1, 1, 1, 1724868414.3982143]
VI_at__the_End : ['1.201', '0.4843', '1.800', '0.1395', '1.803', '0.1149', '7.000', '0.7078', 1, 1, 1, 1, 1724868470.6648657]