TEST_NAME : Wafer
TEST_DATE : 24_08_28-20_05_10
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-015-005-022-13 | FUSED_ID : 6359364768388632941
  IC_TEMP :  -55.59 | VDDM : 1102.35 | AUX_INT :   -8.47 | CsaBias :   67.98
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.27759e-03 / 2
  ADC_P0  : -8.47281e-03 ± 2.42354e-02
  ADC_P1  : 8.54627e-03 ± 6.10720e-04
  ADC_P2  : -5.77911e-06 ± 3.05710e-06
  CSA_Chi2/NDF : 1.46533e-04 / 2
  CSA_P0  : 5.78517e-02 ± 8.07402e-03
  CSA_P1  : 9.85926e-03 ± 6.08319e-04
  CSA_P2  : -4.89581e-05 ± 9.26398e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [3, 29, 33, 57, 87]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  5
 | P_BROKEN_FAST :  [24, 27, 57, 83, 105]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2903', '1.800', '0.1439', '1.800', '0.0943', '7.000', '0.7065', 1, 1, 1, 1, 1724868310.4891162]
VI_after__Init : ['1.201', '0.2904', '1.800', '0.1437', '1.800', '0.0886', '7.000', '0.7067', 1, 1, 1, 1, 1724868318.5435205]
VI_at__the_End : ['1.201', '0.4803', '1.800', '0.1363', '1.800', '0.1134', '7.000', '0.7076', 1, 1, 1, 1, 1724868374.4251833]