TEST_NAME : Wafer
TEST_DATE : 24_08_28-20_38_37
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-015-006-005-04 | FUSED_ID : 6359364768388636756
  IC_TEMP :  -62.88 | VDDM : 1124.47 | AUX_INT :   -8.11 | CsaBias :   45.81
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 9.24311e-04 / 2
  ADC_P0  : -8.11447e-03 ± 2.04967e-02
  ADC_P1  : 9.03423e-03 ± 5.27975e-04
  ADC_P2  : -7.79046e-06 ± 2.69165e-06
  CSA_Chi2/NDF : 2.07475e-04 / 2
  CSA_P0  : 5.93182e-02 ± 9.60738e-03
  CSA_P1  : 1.06044e-02 ± 7.23847e-04
  CSA_P2  : -6.03728e-05 ± 1.10233e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  7
 | N_BROKEN_FAST :  [8, 35, 47, 49, 52, 95, 120]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  4
 | P_BROKEN_FAST :  [20, 72, 76, 103]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.1981', '1.800', '0.1556', '1.800', '0.0857', '7.000', '0.7073', 1, 1, 1, 1, 1724870316.7079089]
VI_after__Init : ['1.201', '0.1982', '1.800', '0.1555', '1.800', '0.0800', '7.000', '0.7070', 1, 1, 1, 1, 1724870324.8102686]
VI_at__the_End : ['1.201', '0.4863', '1.800', '0.1391', '1.800', '0.1132', '7.000', '0.7078', 1, 1, 1, 1, 1724870386.581507]