TEST_NAME : Wafer
TEST_DATE : 24_08_28-20_43_25
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-015-006-008-04 | FUSED_ID : 6359364768388636804
  IC_TEMP :  -57.63 | VDDM : 1131.71 | AUX_INT :  -97.61 | CsaBias :   -8.61
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.13231e-03 / 2
  ADC_P0  : -9.76083e-02 ± 2.70366e-02
  ADC_P1  : 9.98877e-03 ± 6.58731e-04
  ADC_P2  : -1.10618e-05 ± 3.15843e-06
  CSA_Chi2/NDF : 1.42054e-04 / 2
  CSA_P0  : 5.98913e-02 ± 7.94966e-03
  CSA_P1  : 1.01862e-02 ± 5.98949e-04
  CSA_P2  : -5.30593e-05 ± 9.12129e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  4
 | N_BROKEN_FAST :  [30, 87, 104, 113]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  8
 | P_BROKEN_FAST :  [1, 20, 22, 46, 47, 62, 65, 79]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2352', '1.800', '0.1561', '1.799', '0.0929', '7.000', '0.7070', 1, 1, 1, 1, 1724870604.9887092]
VI_after__Init : ['1.202', '0.2352', '1.800', '0.1560', '1.800', '0.0871', '7.000', '0.7067', 1, 1, 1, 1, 1724870613.6690614]
VI_at__the_End : ['1.201', '0.4858', '1.800', '0.1360', '1.800', '0.1118', '7.000', '0.7077', 1, 1, 1, 1, 1724870675.271268]