TEST_NAME : Wafer
TEST_DATE : 24_08_28-20_51_25
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-015-006-013-04 | FUSED_ID : 6359364768388636884
  IC_TEMP :  -54.60 | VDDM : 1122.34 | AUX_INT :  -10.06 | CsaBias :   73.00
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.61360e-03 / 2
  ADC_P0  : -1.00638e-02 ± 2.72172e-02
  ADC_P1  : 8.36658e-03 ± 6.56718e-04
  ADC_P2  : -6.02976e-06 ± 3.15612e-06
  CSA_Chi2/NDF : 1.50421e-04 / 2
  CSA_P0  : 5.81474e-02 ± 8.18044e-03
  CSA_P1  : 1.00407e-02 ± 6.16337e-04
  CSA_P2  : -5.13986e-05 ± 9.38609e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [19, 21, 52, 107, 120]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  7
 | P_BROKEN_FAST :  [19, 31, 52, 70, 80, 105, 127]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3885', '1.800', '0.1563', '1.800', '0.0992', '7.000', '0.7076', 1, 1, 1, 1, 1724871085.1659815]
VI_after__Init : ['1.201', '0.3887', '1.800', '0.1564', '1.800', '0.0915', '7.000', '0.7067', 1, 1, 1, 1, 1724871093.9422991]
VI_at__the_End : ['1.201', '0.4834', '1.800', '0.1349', '1.803', '0.1133', '7.000', '0.7076', 1, 1, 1, 1, 1724871148.0781145]