TEST_NAME : Wafer
TEST_DATE : 24_08_28-20_54_37
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-015-006-015-04 | FUSED_ID : 6359364768388636916
  IC_TEMP :  -56.26 | VDDM : 1132.05 | AUX_INT :   -9.03 | CsaBias :   67.57
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.30099e-03 / 2
  ADC_P0  : -9.02504e-03 ± 2.44453e-02
  ADC_P1  : 8.56191e-03 ± 6.14636e-04
  ADC_P2  : -5.75618e-06 ± 3.07960e-06
  CSA_Chi2/NDF : 1.42426e-04 / 2
  CSA_P0  : 5.97116e-02 ± 7.96006e-03
  CSA_P1  : 1.00777e-02 ± 5.99733e-04
  CSA_P2  : -5.16240e-05 ± 9.13323e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  7
 | N_BROKEN_FAST :  [13, 38, 42, 51, 54, 67, 102]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [5, 17, 72, 77, 97, 118]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2663', '1.800', '0.1293', '1.800', '0.0898', '7.000', '0.7070', 1, 1, 1, 1, 1724871277.6310568]
VI_after__Init : ['1.201', '0.2664', '1.800', '0.1293', '1.800', '0.0844', '7.000', '0.7069', 1, 1, 1, 1, 1724871285.7455618]
VI_at__the_End : ['1.201', '0.4834', '1.800', '0.1378', '1.800', '0.1137', '7.000', '0.7076', 1, 1, 1, 1, 1724871340.4133692]