TEST_NAME : Wafer
TEST_DATE : 24_08_28-20_57_48
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-015-006-017-03 | FUSED_ID : 6359364768388636947
  IC_TEMP :  -55.18 | VDDM : 1109.91 | AUX_INT :   -8.41 | CsaBias :   83.04
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.21894e-03 / 2
  ADC_P0  : -8.41449e-03 ± 2.36640e-02
  ADC_P1  : 8.37487e-03 ± 5.83968e-04
  ADC_P2  : -5.53134e-06 ± 2.86377e-06
  CSA_Chi2/NDF : 1.17849e-04 / 2
  CSA_P0  : 5.79221e-02 ± 7.24079e-03
  CSA_P1  : 9.75011e-03 ± 5.45541e-04
  CSA_P2  : -4.75543e-05 ± 8.30795e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  10
 | N_BROKEN_FAST :  [27, 42, 53, 55, 90, 91, 98, 103, 107, 120]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  4
 | P_BROKEN_FAST :  [6, 40, 53, 102]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3511', '1.800', '0.1554', '1.800', '0.0937', '7.000', '0.7072', 1, 1, 1, 1, 1724871468.5434053]
VI_after__Init : ['1.201', '0.3513', '1.800', '0.1554', '1.800', '0.0880', '7.000', '0.7072', 1, 1, 1, 1, 1724871476.6099694]
VI_at__the_End : ['1.201', '0.4786', '1.800', '0.1376', '1.803', '0.1135', '7.000', '0.7077', 1, 1, 1, 1, 1724871539.1770515]