TEST_NAME : Wafer
TEST_DATE : 24_08_28-21_02_36
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-015-006-020-03 | FUSED_ID : 6359364768388636995
  IC_TEMP :  -61.26 | VDDM : 1122.72 | AUX_INT :   -9.67 | CsaBias :   61.69
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.34542e-03 / 2
  ADC_P0  : -9.66795e-03 ± 2.47902e-02
  ADC_P1  : 8.97929e-03 ± 6.35153e-04
  ADC_P2  : -7.41612e-06 ± 3.23568e-06
  CSA_Chi2/NDF : 1.79008e-04 / 2
  CSA_P0  : 5.76871e-02 ± 8.92397e-03
  CSA_P1  : 1.04183e-02 ± 6.72357e-04
  CSA_P2  : -5.78107e-05 ± 1.02392e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  6
 | N_BROKEN_FAST :  [40, 45, 59, 70, 73, 74]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  4
 | P_BROKEN_FAST :  [5, 12, 65, 122]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3718', '1.800', '0.1645', '1.800', '0.0903', '7.000', '0.7076', 1, 1, 1, 1, 1724871756.064424]
VI_after__Init : ['1.201', '0.3715', '1.800', '0.1646', '1.800', '0.0843', '7.000', '0.7074', 1, 1, 1, 1, 1724871764.2648015]
VI_at__the_End : ['1.201', '0.4799', '1.800', '0.1370', '1.799', '0.1129', '7.000', '0.7083', 1, 1, 1, 1, 1724871818.3746412]