TEST_NAME : Wafer
TEST_DATE : 24_08_28-21_04_11
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-015-006-021-03 | FUSED_ID : 6359364768388637011
  IC_TEMP :  -54.75 | VDDM : 1093.89 | AUX_INT :   -5.66 | CsaBias :   60.55
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 4.52940e-04 / 2
  ADC_P0  : -5.66156e-03 ± 1.42606e-02
  ADC_P1  : 8.33379e-03 ± 3.34693e-04
  ADC_P2  : -7.23625e-06 ± 1.54519e-06
  CSA_Chi2/NDF : 1.25443e-04 / 2
  CSA_P0  : 5.75061e-02 ± 7.47043e-03
  CSA_P1  : 9.91411e-03 ± 5.62843e-04
  CSA_P2  : -5.13800e-05 ± 8.57144e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  3
 | N_BROKEN_FAST :  [50, 74, 98]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  7
 | P_BROKEN_FAST :  [0, 3, 37, 42, 52, 85, 115]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.4062', '1.800', '0.2459', '1.799', '0.1103', '7.000', '0.7076', 1, 1, 1, 1, 1724871851.0411189]
VI_after__Init : ['1.201', '0.4068', '1.800', '0.2458', '1.800', '0.1045', '7.000', '0.7076', 1, 1, 1, 1, 1724871859.764542]
VI_at__the_End : ['1.201', '0.4753', '1.729', '0.2500', '1.800', '0.1257', '7.000', '0.7084', 1, 1, 1, 1, 1724871921.07176]