TEST_NAME : Wafer
TEST_DATE : 24_08_28-21_07_23
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-015-006-023-03 | FUSED_ID : 6359364768388637043
  IC_TEMP :  -56.16 | VDDM : 1123.45 | AUX_INT :  -36.05 | CsaBias :   45.91
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.28653e-03 / 2
  ADC_P0  : -3.60469e-02 ± 2.56973e-02
  ADC_P1  : 9.17718e-03 ± 6.53472e-04
  ADC_P2  : -7.81330e-06 ± 3.27970e-06
  CSA_Chi2/NDF : 1.53557e-04 / 2
  CSA_P0  : 6.10031e-02 ± 8.26527e-03
  CSA_P1  : 9.99661e-03 ± 6.22729e-04
  CSA_P2  : -4.97387e-05 ± 9.48342e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  4
 | N_BROKEN_FAST :  [30, 56, 64, 80]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  10
 | P_BROKEN_FAST :  [6, 9, 14, 32, 44, 53, 55, 81, 104, 127]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2750', '1.800', '0.1370', '1.799', '0.0930', '7.000', '0.7079', 1, 1, 1, 1, 1724872043.0474668]
VI_after__Init : ['1.201', '0.2753', '1.800', '0.1370', '1.800', '0.0872', '7.000', '0.7074', 1, 1, 1, 1, 1724872051.872634]
VI_at__the_End : ['1.201', '0.4898', '1.800', '0.1385', '1.800', '0.1121', '7.000', '0.7085', 1, 1, 1, 1, 1724872111.568119]