TEST_NAME : Wafer
TEST_DATE : 24_08_28-21_08_59
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-015-006-024-03 | FUSED_ID : 6359364768388637059
  IC_TEMP :  -56.77 | VDDM : 1122.06 | AUX_INT :   -8.12 | CsaBias :   76.37
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.08484e-03 / 2
  ADC_P0  : -8.11991e-03 ± 2.22982e-02
  ADC_P1  : 8.50749e-03 ± 5.56854e-04
  ADC_P2  : -5.88597e-06 ± 2.76104e-06
  CSA_Chi2/NDF : 1.63595e-04 / 2
  CSA_P0  : 5.73301e-02 ± 8.53114e-03
  CSA_P1  : 9.79978e-03 ± 6.42760e-04
  CSA_P2  : -4.80757e-05 ± 9.78847e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  6
 | N_BROKEN_FAST :  [8, 23, 32, 47, 79, 107]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  5
 | P_BROKEN_FAST :  [10, 25, 42, 72, 98]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3837', '1.800', '0.1282', '1.800', '0.0937', '7.000', '0.7078', 1, 1, 1, 1, 1724872139.2150772]
VI_after__Init : ['1.201', '0.3840', '1.800', '0.1283', '1.800', '0.0883', '7.000', '0.7075', 1, 1, 1, 1, 1724872147.3483603]
VI_at__the_End : ['1.201', '0.4805', '1.800', '0.1378', '1.800', '0.1135', '7.000', '0.7083', 1, 1, 1, 1, 1724872210.075634]