TEST_NAME : Wafer
TEST_DATE : 24_08_28-21_47_21
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-015-007-005-09 | FUSED_ID : 6359364768388640857
  IC_TEMP :  -56.84 | VDDM : 1129.69 | AUX_INT :   -7.21 | CsaBias :   71.25
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.03043e-03 / 2
  ADC_P0  : -7.21278e-03 ± 2.17647e-02
  ADC_P1  : 8.76932e-03 ± 5.70598e-04
  ADC_P2  : -5.72680e-06 ± 2.96508e-06
  CSA_Chi2/NDF : 2.02083e-04 / 2
  CSA_P0  : 5.93174e-02 ± 9.48172e-03
  CSA_P1  : 1.05768e-02 ± 7.14379e-04
  CSA_P2  : -5.71820e-05 ± 1.08791e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  7
 | N_BROKEN_FAST :  [6, 27, 78, 89, 90, 119, 125]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  2
 | P_BROKEN_FAST :  [31, 97]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1925', '1.800', '0.1606', '1.799', '0.0839', '7.000', '0.7072', 1, 1, 1, 1, 1724874441.2215898]
VI_after__Init : ['1.201', '0.1926', '1.800', '0.1606', '1.800', '0.0782', '7.000', '0.7075', 1, 1, 1, 1, 1724874449.3989363]
VI_at__the_End : ['1.201', '0.4936', '1.800', '0.1400', '1.804', '0.1128', '7.000', '0.7079', 1, 1, 1, 1, 1724874504.496705]