TEST_NAME : Wafer
TEST_DATE : 24_08_28-21_45_45
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-015-007-006-09 | FUSED_ID : 6359364768388640873
  IC_TEMP :  -60.06 | VDDM : 1129.75 | AUX_INT :   -8.43 | CsaBias :   60.97
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.17543e-03 / 2
  ADC_P0  : -8.42657e-03 ± 2.31928e-02
  ADC_P1  : 8.72832e-03 ± 5.86332e-04
  ADC_P2  : -6.70491e-06 ± 2.93685e-06
  CSA_Chi2/NDF : 1.60989e-04 / 2
  CSA_P0  : 5.83425e-02 ± 8.46293e-03
  CSA_P1  : 1.00413e-02 ± 6.37621e-04
  CSA_P2  : -5.11167e-05 ± 9.71021e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  9
 | N_BROKEN_FAST :  [5, 24, 41, 49, 66, 103, 108, 123, 124]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  10
 | P_BROKEN_FAST :  [8, 18, 27, 56, 75, 77, 82, 85, 89, 93]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2261', '1.800', '0.1606', '1.799', '0.0894', '7.000', '0.7076', 1, 1, 1, 1, 1724874344.9388938]
VI_after__Init : ['1.201', '0.2261', '1.800', '0.1607', '1.800', '0.0820', '7.000', '0.7072', 1, 1, 1, 1, 1724874353.2442853]
VI_at__the_End : ['1.201', '0.4829', '1.800', '0.1378', '1.800', '0.1145', '7.000', '0.7079', 1, 1, 1, 1, 1724874408.4980345]