TEST_NAME : Wafer
TEST_DATE : 24_08_28-21_40_57
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-015-007-009-09 | FUSED_ID : 6359364768388640921
  IC_TEMP :  -60.54 | VDDM : 1125.40 | AUX_INT :   -9.11 | CsaBias :   69.05
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.35031e-03 / 2
  ADC_P0  : -9.10517e-03 ± 2.49135e-02
  ADC_P1  : 8.73755e-03 ± 6.39925e-04
  ADC_P2  : -5.96570e-06 ± 3.27436e-06
  CSA_Chi2/NDF : 1.83990e-04 / 2
  CSA_P0  : 6.02344e-02 ± 9.04732e-03
  CSA_P1  : 1.03423e-02 ± 6.81650e-04
  CSA_P2  : -5.72490e-05 ± 1.03807e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [80]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  11
 | P_BROKEN_FAST :  [2, 44, 55, 66, 96, 99, 109, 110, 117, 124, 126]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3475', '1.800', '0.1422', '1.800', '0.0994', '7.000', '0.7076', 1, 1, 1, 1, 1724874056.539091]
VI_after__Init : ['1.201', '0.3479', '1.800', '0.1425', '1.800', '0.0911', '7.000', '0.7070', 1, 1, 1, 1, 1724874065.2673714]
VI_at__the_End : ['1.201', '0.4798', '1.800', '0.1418', '1.800', '0.1152', '7.000', '0.7076', 1, 1, 1, 1, 1724874128.5115426]