TEST_NAME : Wafer
TEST_DATE : 24_08_28-21_39_21
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-015-007-010-09 | FUSED_ID : 6359364768388640937
  IC_TEMP :  -58.77 | VDDM : 1129.14 | AUX_INT :   -7.36 | CsaBias :   68.61
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.09237e-03 / 2
  ADC_P0  : -7.35851e-03 ± 2.23785e-02
  ADC_P1  : 8.49572e-03 ± 5.58249e-04
  ADC_P2  : -6.12719e-06 ± 2.74967e-06
  CSA_Chi2/NDF : 1.62126e-04 / 2
  CSA_P0  : 5.88400e-02 ± 8.49274e-03
  CSA_P1  : 1.00266e-02 ± 6.39867e-04
  CSA_P2  : -5.10041e-05 ± 9.74442e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  8
 | N_BROKEN_FAST :  [11, 19, 56, 59, 94, 96, 99, 122]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  11
 | P_BROKEN_FAST :  [0, 5, 24, 40, 63, 80, 92, 104, 107, 112, 120]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.1974', '1.800', '0.1635', '1.800', '0.0874', '7.000', '0.7076', 1, 1, 1, 1, 1724873960.4794219]
VI_after__Init : ['1.201', '0.1974', '1.800', '0.1636', '1.800', '0.0800', '7.000', '0.7067', 1, 1, 1, 1, 1724873969.3887386]
VI_at__the_End : ['1.201', '0.4826', '1.800', '0.1386', '1.799', '0.1125', '7.000', '0.7074', 1, 1, 1, 1, 1724874023.2836168]