TEST_NAME : Wafer
TEST_DATE : 24_08_28-21_29_44
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-015-007-016-14 | FUSED_ID : 6359364768388641038
  IC_TEMP :  -55.22 | VDDM : 1124.20 | AUX_INT :   -8.66 | CsaBias :   65.02
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.22679e-03 / 2
  ADC_P0  : -8.65582e-03 ± 2.37318e-02
  ADC_P1  : 8.23464e-03 ± 5.73750e-04
  ADC_P2  : -5.42722e-06 ± 2.75760e-06
  CSA_Chi2/NDF : 1.52519e-04 / 2
  CSA_P0  : 5.92815e-02 ± 8.23728e-03
  CSA_P1  : 1.00941e-02 ± 6.20620e-04
  CSA_P2  : -5.27435e-05 ± 9.45130e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  7
 | N_BROKEN_FAST :  [0, 11, 20, 61, 84, 105, 120]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  18
 | P_BROKEN_FAST :  [24, 34, 42, 52, 53, 57, 61, 63, 67, 73, 74, 75, 77, 79, 83, 105, 106, 114]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.1750', '1.800', '0.1884', '1.800', '0.0843', '7.000', '0.7078', 1, 1, 1, 1, 1724873384.0475972]
VI_after__Init : ['1.201', '0.1750', '1.800', '0.1882', '1.799', '0.0772', '7.000', '0.7069', 1, 1, 1, 1, 1724873392.1879094]
VI_at__the_End : ['1.201', '0.4829', '1.800', '0.1352', '1.803', '0.1126', '7.000', '0.7079', 1, 1, 1, 1, 1724873452.1362622]