TEST_NAME : Wafer
TEST_DATE : 24_08_28-21_28_08
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-015-007-017-14 | FUSED_ID : 6359364768388641054
  IC_TEMP :  -55.94 | VDDM : 1131.83 | AUX_INT :   -7.15 | CsaBias :   63.84
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 7.85564e-04 / 2
  ADC_P0  : -7.15398e-03 ± 1.89334e-02
  ADC_P1  : 8.92827e-03 ± 4.95077e-04
  ADC_P2  : -6.73683e-06 ± 2.56426e-06
  CSA_Chi2/NDF : 1.70189e-04 / 2
  CSA_P0  : 6.04330e-02 ± 8.70138e-03
  CSA_P1  : 1.06430e-02 ± 6.55586e-04
  CSA_P2  : -5.93934e-05 ± 9.98381e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  6
 | N_BROKEN_FAST :  [22, 35, 48, 57, 74, 88]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [3, 8, 37, 64, 81, 123]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.4906', '1.800', '0.1313', '1.800', '0.0972', '7.000', '0.7076', 1, 1, 1, 1, 1724873288.1698887]
VI_after__Init : ['1.201', '0.4918', '1.800', '0.1317', '1.800', '0.0894', '7.000', '0.7069', 1, 1, 1, 1, 1724873296.8451898]
VI_at__the_End : ['1.201', '0.4899', '1.800', '0.1396', '1.803', '0.1132', '7.000', '0.7078', 1, 1, 1, 1, 1724873357.5575678]