TEST_NAME : Wafer
TEST_DATE : 24_08_28-21_13_46
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-015-007-026-14 | FUSED_ID : 6359364768388641198
  IC_TEMP :  -61.70 | VDDM : 1127.73 | AUX_INT :   -7.84 | CsaBias :   54.98
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.00200e-03 / 2
  ADC_P0  : -7.84083e-03 ± 2.13934e-02
  ADC_P1  : 9.02542e-03 ± 5.59502e-04
  ADC_P2  : -7.24277e-06 ± 2.89499e-06
  CSA_Chi2/NDF : 1.91170e-04 / 2
  CSA_P0  : 6.13697e-02 ± 9.22214e-03
  CSA_P1  : 1.01226e-02 ± 6.94822e-04
  CSA_P2  : -5.14281e-05 ± 1.05813e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  35
 | N_BROKEN_FAST :  [0, 1, 3, 6, 8, 15, 19, 22]
 | N_BROKEN_SLOW :  [0, 1, 2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13, 14, 15, 16, 17, 18, 19, 20, 21, 22, 23, 24, 25, 26]
   P_BROKEN_DISC :  44
 | P_BROKEN_FAST :  [0, 1, 4, 5, 6, 7, 8, 10, 12, 13, 15, 16, 18, 19, 20, 21, 22, 23, 39, 72, 74, 103]
 | P_BROKEN_SLOW :  [0, 1, 2, 3, 4, 5, 6, 7, 8, 9, 10, 12, 13, 14, 15, 16, 18, 19, 20, 21, 22, 23]
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3145', '1.800', '0.1370', '1.799', '0.1003', '7.000', '0.7080', 1, 1, 1, 1, 1724872425.9580145]
VI_after__Init : ['1.201', '0.3145', '1.800', '0.1371', '1.800', '0.0943', '7.000', '0.7076', 1, 1, 1, 1, 1724872434.0484068]
VI_at__the_End : ['1.201', '0.4909', '1.800', '0.1391', '1.803', '0.1151', '7.000', '0.7086', 1, 1, 1, 1, 1724872496.0885954]