TEST_NAME : Wafer
TEST_DATE : 24_08_28-21_52_08
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-015-008-002-13 | FUSED_ID : 6359364768388644909
  IC_TEMP :  -56.52 | VDDM : 1104.90 | AUX_INT :   -9.13 | CsaBias :   67.57
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.33709e-03 / 2
  ADC_P0  : -9.13147e-03 ± 2.47822e-02
  ADC_P1  : 8.57509e-03 ± 6.23105e-04
  ADC_P2  : -5.82496e-06 ± 3.12204e-06
  CSA_Chi2/NDF : 1.66529e-04 / 2
  CSA_P0  : 5.95038e-02 ± 8.60732e-03
  CSA_P1  : 1.02433e-02 ± 6.48499e-04
  CSA_P2  : -5.41112e-05 ± 9.87587e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  4
 | N_BROKEN_FAST :  [2, 30, 110, 117]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  8
 | P_BROKEN_FAST :  [3, 23, 34, 37, 66, 100, 111, 112]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.4275', '1.800', '0.1339', '1.800', '0.0933', '7.000', '0.7082', 1, 1, 1, 1, 1724874728.59543]
VI_after__Init : ['1.201', '0.4280', '1.800', '0.1339', '1.800', '0.0857', '7.000', '0.7072', 1, 1, 1, 1, 1724874736.7169096]
VI_at__the_End : ['1.201', '0.4826', '1.800', '0.1389', '1.800', '0.1122', '7.000', '0.7083', 1, 1, 1, 1, 1724874793.4574912]