TEST_NAME : Wafer
TEST_DATE : 24_08_28-21_53_44
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-015-008-003-13 | FUSED_ID : 6359364768388644925
  IC_TEMP :  -58.34 | VDDM : 1131.32 | AUX_INT :   -8.61 | CsaBias :   78.15
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.51410e-03 / 2
  ADC_P0  : -8.60690e-03 ± 2.64347e-02
  ADC_P1  : 8.73219e-03 ± 6.86861e-04
  ADC_P2  : -5.66698e-06 ± 3.54563e-06
  CSA_Chi2/NDF : 1.84165e-04 / 2
  CSA_P0  : 5.80772e-02 ± 9.05161e-03
  CSA_P1  : 1.02705e-02 ± 6.81973e-04
  CSA_P2  : -5.29986e-05 ± 1.03856e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  9
 | N_BROKEN_FAST :  [9, 13, 37, 77, 78, 94, 106, 110, 116]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  10
 | P_BROKEN_FAST :  [6, 10, 34, 46, 51, 56, 59, 68, 95, 101]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2168', '1.800', '0.1476', '1.799', '0.0850', '7.000', '0.7075', 1, 1, 1, 1, 1724874824.702014]
VI_after__Init : ['1.202', '0.2171', '1.800', '0.1475', '1.800', '0.0796', '7.000', '0.7075', 1, 1, 1, 1, 1724874832.7815259]
VI_at__the_End : ['1.201', '0.4900', '1.800', '0.1388', '1.800', '0.1118', '7.000', '0.7081', 1, 1, 1, 1, 1724874888.2612302]