TEST_NAME : Wafer
TEST_DATE : 24_08_28-21_55_20
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-015-008-004-13 | FUSED_ID : 6359364768388644941
  IC_TEMP :  -53.30 | VDDM : 1127.74 | AUX_INT :   -7.91 | CsaBias :   71.07
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.10042e-03 / 2
  ADC_P0  : -7.91270e-03 ± 2.24737e-02
  ADC_P1  : 8.83160e-03 ± 5.85805e-04
  ADC_P2  : -6.22351e-06 ± 3.02910e-06
  CSA_Chi2/NDF : 1.51059e-04 / 2
  CSA_P0  : 5.96710e-02 ± 8.19777e-03
  CSA_P1  : 9.75542e-03 ± 6.17643e-04
  CSA_P2  : -4.64936e-05 ± 9.40597e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  4
 | N_BROKEN_FAST :  [4, 27, 45, 95]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [29, 44, 58, 60, 85, 91]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3338', '1.800', '0.1234', '1.799', '0.0926', '7.000', '0.7073', 1, 1, 1, 1, 1724874920.1868365]
VI_after__Init : ['1.201', '0.3339', '1.800', '0.1234', '1.800', '0.0870', '7.000', '0.7076', 1, 1, 1, 1, 1724874928.270182]
VI_at__the_End : ['1.201', '0.4858', '1.800', '0.1377', '1.803', '0.1104', '7.000', '0.7083', 1, 1, 1, 1, 1724874982.81097]