TEST_NAME : Wafer
TEST_DATE : 24_08_28-21_56_57
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-015-008-005-13 | FUSED_ID : 6359364768388644957
  IC_TEMP :  -56.98 | VDDM : 1116.91 | AUX_INT :   -7.58 | CsaBias :   76.55
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 9.05824e-04 / 2
  ADC_P0  : -7.58041e-03 ± 2.03375e-02
  ADC_P1  : 8.47581e-03 ± 5.01723e-04
  ADC_P2  : -6.23421e-06 ± 2.45051e-06
  CSA_Chi2/NDF : 1.46293e-04 / 2
  CSA_P0  : 5.74475e-02 ± 8.06742e-03
  CSA_P1  : 1.01520e-02 ± 6.07822e-04
  CSA_P2  : -5.10668e-05 ± 9.25640e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  3
 | N_BROKEN_FAST :  [6, 81, 127]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [9, 20, 40, 63, 80, 100]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.1356', '1.800', '0.1839', '1.800', '0.0853', '7.000', '0.7084', 1, 1, 1, 1, 1724875016.810394]
VI_after__Init : ['1.201', '0.1357', '1.800', '0.1839', '1.800', '0.0779', '7.000', '0.7076', 1, 1, 1, 1, 1724875024.9497964]
VI_at__the_End : ['1.201', '0.4875', '1.800', '0.1385', '1.804', '0.1098', '7.000', '0.7084', 1, 1, 1, 1, 1724875082.932331]