TEST_NAME : Wafer
TEST_DATE : 24_08_28-22_00_09
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-015-008-007-13 | FUSED_ID : 6359364768388644989
  IC_TEMP :  -57.24 | VDDM : 1127.82 | AUX_INT :  -73.82 | CsaBias :   26.58
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.63854e-03 / 2
  ADC_P0  : -7.38154e-02 ± 3.12019e-02
  ADC_P1  : 9.22233e-03 ± 7.41180e-04
  ADC_P2  : -8.66330e-06 ± 3.47276e-06
  CSA_Chi2/NDF : 1.37323e-04 / 2
  CSA_P0  : 5.58254e-02 ± 7.81618e-03
  CSA_P1  : 9.70253e-03 ± 5.88893e-04
  CSA_P2  : -4.87925e-05 ± 8.96814e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  7
 | N_BROKEN_FAST :  [10, 21, 36, 40, 42, 44, 58]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [6, 47, 72, 97, 99, 112]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.1918', '1.800', '0.1598', '1.800', '0.0842', '7.000', '0.7084', 1, 1, 1, 1, 1724875209.1806476]
VI_after__Init : ['1.201', '0.1920', '1.800', '0.1597', '1.800', '0.0768', '7.000', '0.7076', 1, 1, 1, 1, 1724875217.2969024]
VI_at__the_End : ['1.201', '0.4711', '1.800', '0.1345', '1.800', '0.1146', '7.000', '0.7084', 1, 1, 1, 1, 1724875272.4136782]