TEST_NAME : Wafer
TEST_DATE : 24_08_28-22_01_45
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-015-008-008-13 | FUSED_ID : 6359364768388645005
  IC_TEMP :  -61.80 | VDDM : 1128.43 | AUX_INT :   -9.13 | CsaBias :   70.48
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.23827e-03 / 2
  ADC_P0  : -9.12618e-03 ± 2.38096e-02
  ADC_P1  : 8.90477e-03 ± 6.15609e-04
  ADC_P2  : -6.64216e-06 ± 3.17036e-06
  CSA_Chi2/NDF : 1.81117e-04 / 2
  CSA_P0  : 6.10904e-02 ± 8.97640e-03
  CSA_P1  : 1.03046e-02 ± 6.76307e-04
  CSA_P2  : -5.57112e-05 ± 1.02994e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  3
 | N_BROKEN_FAST :  [18, 82, 90]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  8
 | P_BROKEN_FAST :  [3, 15, 35, 63, 67, 95, 109, 120]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3396', '1.800', '0.1760', '1.800', '0.0910', '7.000', '0.7088', 1, 1, 1, 1, 1724875305.3422654]
VI_after__Init : ['1.201', '0.3398', '1.800', '0.1756', '1.800', '0.0831', '7.000', '0.7078', 1, 1, 1, 1, 1724875313.3476307]
VI_at__the_End : ['1.201', '0.4845', '1.800', '0.1419', '1.800', '0.1135', '7.000', '0.7084', 1, 1, 1, 1, 1724875373.8938997]