TEST_NAME : Wafer
TEST_DATE : 24_08_28-22_04_52
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
------------------------------------------------------------
------------------------------------------------------------
ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-015-008-010-13 | FUSED_ID : 6359364768388645037
  IC_TEMP :  -55.96 | VDDM : 1131.74 | AUX_INT :   -8.20 | CsaBias :   74.97
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.10811e-03 / 2
  ADC_P0  : -8.20454e-03 ± 2.25214e-02
  ADC_P1  : 8.37832e-03 ± 5.49104e-04
  ADC_P2  : -6.06357e-06 ± 2.65298e-06
  CSA_Chi2/NDF : 1.22468e-04 / 2
  CSA_P0  : 5.80825e-02 ± 7.38132e-03
  CSA_P1  : 9.73284e-03 ± 5.56129e-04
  CSA_P2  : -4.56685e-05 ± 8.46919e-06
------------------------------------------------------------
ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  6
 | N_BROKEN_FAST :  [7, 37, 41, 96, 110, 119]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  7
 | P_BROKEN_FAST :  [0, 34, 62, 75, 92, 95, 119]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
------------------------------------------------------------
------------------------------------------------------------
VI_before_Init : ['1.201', '0.1262', '1.800', '0.1651', '1.800', '0.0252', '7.000', '0.7055', 1, 1, 1, 1, 1724875492.0737789]
VI_after__Init : ['1.201', '0.1263', '1.800', '0.1651', '1.800', '0.0781', '7.000', '0.7073', 1, 1, 1, 1, 1724875500.0891395]
VI_at__the_End : ['1.201', '0.4855', '1.800', '0.1375', '1.806', '0.1112', '7.000', '0.7083', 1, 1, 1, 1, 1724875554.5300925]