TEST_NAME : Wafer
TEST_DATE : 24_08_28-22_06_28
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-015-008-011-13 | FUSED_ID : 6359364768388645053
  IC_TEMP :  -56.18 | VDDM : 1131.33 | AUX_INT :   -7.84 | CsaBias :   69.75
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.10952e-03 / 2
  ADC_P0  : -7.83558e-03 ± 2.25509e-02
  ADC_P1  : 8.67802e-03 ± 5.73298e-04
  ADC_P2  : -6.31715e-06 ± 2.88545e-06
  CSA_Chi2/NDF : 1.45592e-04 / 2
  CSA_P0  : 6.03570e-02 ± 8.04805e-03
  CSA_P1  : 1.00093e-02 ± 6.06363e-04
  CSA_P2  : -5.09412e-05 ± 9.23418e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [21, 50, 55, 108, 120]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  7
 | P_BROKEN_FAST :  [16, 28, 53, 80, 86, 96, 118]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3819', '1.800', '0.1514', '1.800', '0.0986', '7.000', '0.7082', 1, 1, 1, 1, 1724875587.9714458]
VI_after__Init : ['1.201', '0.3823', '1.800', '0.1516', '1.801', '0.0900', '7.000', '0.7074', 1, 1, 1, 1, 1724875596.246759]
VI_at__the_End : ['1.202', '0.4823', '1.800', '0.1405', '1.800', '0.1135', '7.000', '0.7081', 1, 1, 1, 1, 1724875659.553948]