TEST_NAME : Wafer
TEST_DATE : 24_08_28-22_08_04
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-015-008-012-13 | FUSED_ID : 6359364768388645069
  IC_TEMP :  -52.14 | VDDM : 1130.57 | AUX_INT :   -7.30 | CsaBias :   59.74
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.10661e-03 / 2
  ADC_P0  : -7.29810e-03 ± 2.25971e-02
  ADC_P1  : 8.41633e-03 ± 5.77811e-04
  ADC_P2  : -4.59670e-06 ± 2.93731e-06
  CSA_Chi2/NDF : 1.42421e-04 / 2
  CSA_P0  : 5.95020e-02 ± 7.95994e-03
  CSA_P1  : 1.04226e-02 ± 5.99724e-04
  CSA_P2  : -5.63102e-05 ± 9.13309e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  8
 | N_BROKEN_FAST :  [15, 34, 36, 84, 98, 102, 116, 121]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  4
 | P_BROKEN_FAST :  [18, 23, 97, 117]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3980', '1.800', '0.1635', '1.800', '0.1000', '7.000', '0.7083', 1, 1, 1, 1, 1724875683.9131143]
VI_after__Init : ['1.201', '0.3987', '1.800', '0.1636', '1.800', '0.0923', '7.000', '0.7072', 1, 1, 1, 1, 1724875691.9504843]
VI_at__the_End : ['1.201', '0.4887', '1.800', '0.1395', '1.799', '0.1135', '7.000', '0.7080', 1, 1, 1, 1, 1724875749.4470139]