TEST_NAME : Wafer
TEST_DATE : 24_08_28-22_09_39
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-015-008-013-13 | FUSED_ID : 6359364768388645085
  IC_TEMP :  -57.08 | VDDM : 1136.20 | AUX_INT :   -7.04 | CsaBias :   76.36
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 9.22648e-04 / 2
  ADC_P0  : -7.03742e-03 ± 2.06020e-02
  ADC_P1  : 8.38798e-03 ± 5.22039e-04
  ADC_P2  : -4.80042e-06 ± 2.62837e-06
  CSA_Chi2/NDF : 1.20395e-04 / 2
  CSA_P0  : 6.11574e-02 ± 7.31858e-03
  CSA_P1  : 9.93274e-03 ± 5.51402e-04
  CSA_P2  : -5.11046e-05 ± 8.39720e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  8
 | N_BROKEN_FAST :  [5, 18, 38, 88, 91, 94, 104, 124]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [19, 20, 44, 95, 101, 121]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.1715', '1.800', '0.1622', '1.800', '0.0837', '7.000', '0.7072', 1, 1, 1, 1, 1724875779.4358337]
VI_after__Init : ['1.201', '0.1715', '1.800', '0.1621', '1.800', '0.0779', '7.000', '0.7072', 1, 1, 1, 1, 1724875787.6930501]
VI_at__the_End : ['1.201', '0.4786', '1.800', '0.1366', '1.799', '0.1135', '7.000', '0.7079', 1, 1, 1, 1, 1724875844.249838]