TEST_NAME : Wafer
TEST_DATE : 24_08_28-22_12_52
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-015-008-015-13 | FUSED_ID : 6359364768388645117
  IC_TEMP :  -55.54 | VDDM : 1134.90 | AUX_INT :   -7.06 | CsaBias :   75.24
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 9.92034e-04 / 2
  ADC_P0  : -7.06306e-03 ± 2.13415e-02
  ADC_P1  : 8.28395e-03 ± 5.25984e-04
  ADC_P2  : -5.36020e-06 ± 2.56496e-06
  CSA_Chi2/NDF : 1.25211e-04 / 2
  CSA_P0  : 5.89909e-02 ± 7.46352e-03
  CSA_P1  : 9.90816e-03 ± 5.62323e-04
  CSA_P2  : -4.87425e-05 ± 8.56351e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  7
 | N_BROKEN_FAST :  [7, 16, 53, 82, 96, 106, 124]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [3, 10, 16, 33, 44, 77]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3327', '1.800', '0.1523', '1.799', '0.0869', '7.000', '0.7072', 1, 1, 1, 1, 1724875971.6479125]
VI_after__Init : ['1.201', '0.3327', '1.800', '0.1516', '1.800', '0.0812', '7.000', '0.7073', 1, 1, 1, 1, 1724875979.7103915]
VI_at__the_End : ['1.200', '0.4830', '1.800', '0.1363', '1.803', '0.1114', '7.000', '0.7079', 1, 1, 1, 1, 1724876041.4556258]