TEST_NAME : Wafer
TEST_DATE : 24_08_28-22_14_28
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-015-008-016-10 | FUSED_ID : 6359364768388645130
  IC_TEMP :  -54.11 | VDDM : 1127.29 | AUX_INT :   -7.73 | CsaBias :   67.95
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 9.10080e-04 / 2
  ADC_P0  : -7.73180e-03 ± 2.03919e-02
  ADC_P1  : 8.46304e-03 ± 5.04700e-04
  ADC_P2  : -5.97492e-06 ± 2.47892e-06
  CSA_Chi2/NDF : 1.36333e-04 / 2
  CSA_P0  : 5.96611e-02 ± 7.78796e-03
  CSA_P1  : 9.97809e-03 ± 5.86766e-04
  CSA_P2  : -4.97978e-05 ± 8.93576e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  7
 | N_BROKEN_FAST :  [29, 39, 40, 42, 68, 94, 124]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  4
 | P_BROKEN_FAST :  [29, 42, 61, 70]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.4372', '1.800', '0.1933', '1.799', '0.0919', '7.000', '0.7069', 1, 1, 1, 1, 1724876068.0025997]
VI_after__Init : ['1.201', '0.4377', '1.800', '0.1934', '1.800', '0.0859', '7.000', '0.7070', 1, 1, 1, 1, 1724876076.2620704]
VI_at__the_End : ['1.201', '0.4893', '1.800', '0.1387', '1.799', '0.1104', '7.000', '0.7080', 1, 1, 1, 1, 1724876136.7403]