TEST_NAME : Wafer
TEST_DATE : 24_08_28-22_17_40
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-015-008-018-10 | FUSED_ID : 6359364768388645162
  IC_TEMP :  -55.90 | VDDM : 1121.09 | AUX_INT :   -8.85 | CsaBias :   78.00
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.35150e-03 / 2
  ADC_P0  : -8.85280e-03 ± 2.49165e-02
  ADC_P1  : 8.74785e-03 ± 6.37833e-04
  ADC_P2  : -6.25718e-06 ± 3.24457e-06
  CSA_Chi2/NDF : 1.38806e-04 / 2
  CSA_P0  : 5.94798e-02 ± 7.85827e-03
  CSA_P1  : 1.00439e-02 ± 5.92064e-04
  CSA_P2  : -5.07185e-05 ± 9.01644e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  9
 | N_BROKEN_FAST :  [5, 9, 14, 31, 34, 71, 102, 107, 111]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  3
 | P_BROKEN_FAST :  [4, 97, 109]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2316', '1.800', '0.1537', '1.800', '0.0880', '7.000', '0.7070', 1, 1, 1, 1, 1724876260.6447897]
VI_after__Init : ['1.201', '0.2317', '1.800', '0.1537', '1.800', '0.0823', '7.000', '0.7069', 1, 1, 1, 1, 1724876268.6362002]
VI_at__the_End : ['1.201', '0.4846', '1.800', '0.1391', '1.800', '0.1126', '7.000', '0.7076', 1, 1, 1, 1, 1724876327.821684]