TEST_NAME : Wafer
TEST_DATE : 24_08_28-22_22_29
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-015-008-021-10 | FUSED_ID : 6359364768388645210
  IC_TEMP :  -51.85 | VDDM : 1130.41 | AUX_INT :   -8.52 | CsaBias :   83.07
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.25737e-03 / 2
  ADC_P0  : -8.52239e-03 ± 2.40341e-02
  ADC_P1  : 8.38787e-03 ± 5.93101e-04
  ADC_P2  : -5.59777e-06 ± 2.90857e-06
  CSA_Chi2/NDF : 9.68714e-05 / 2
  CSA_P0  : 5.99155e-02 ± 6.56478e-03
  CSA_P1  : 9.51278e-03 ± 4.94609e-04
  CSA_P2  : -4.10578e-05 ± 7.53230e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  6
 | N_BROKEN_FAST :  [2, 10, 80, 85, 88, 106]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [0, 2, 5, 70, 96, 116]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3753', '1.800', '0.1318', '1.800', '0.0919', '7.000', '0.7069', 1, 1, 1, 1, 1724876549.016761]
VI_after__Init : ['1.201', '0.3753', '1.800', '0.1318', '1.800', '0.0862', '7.000', '0.7069', 1, 1, 1, 1, 1724876557.199069]
VI_at__the_End : ['1.201', '0.4921', '1.800', '0.1377', '1.799', '0.1113', '7.000', '0.7074', 1, 1, 1, 1, 1724876617.4924057]