TEST_NAME : Wafer
TEST_DATE : 24_08_28-22_24_05
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-015-008-022-10 | FUSED_ID : 6359364768388645226
  IC_TEMP :  -59.84 | VDDM : 1117.53 | AUX_INT :  -10.06 | CsaBias :   60.26
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.51811e-03 / 2
  ADC_P0  : -1.00597e-02 ± 2.63662e-02
  ADC_P1  : 8.84683e-03 ± 6.67375e-04
  ADC_P2  : -7.05814e-06 ± 3.36169e-06
  CSA_Chi2/NDF : 1.72809e-04 / 2
  CSA_P0  : 6.08535e-02 ± 8.76811e-03
  CSA_P1  : 1.04917e-02 ± 6.60614e-04
  CSA_P2  : -5.58775e-05 ± 1.00604e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  9
 | N_BROKEN_FAST :  [11, 18, 39, 50, 53, 77, 80, 96, 115]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  2
 | P_BROKEN_FAST :  [80, 102]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2151', '1.800', '0.1216', '1.800', '0.0793', '7.000', '0.7065', 1, 1, 1, 1, 1724876644.9453843]
VI_after__Init : ['1.201', '0.2152', '1.800', '0.1214', '1.800', '0.0737', '7.000', '0.7070', 1, 1, 1, 1, 1724876652.9917262]
VI_at__the_End : ['1.201', '0.4954', '1.800', '0.1403', '1.800', '0.1125', '7.000', '0.7079', 1, 1, 1, 1, 1724876715.7119234]