TEST_NAME : Wafer
TEST_DATE : 24_08_28-22_27_17
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-015-008-024-10 | FUSED_ID : 6359364768388645258
  IC_TEMP :  -55.67 | VDDM : 1128.85 | AUX_INT :   -9.11 | CsaBias :   74.66
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.33944e-03 / 2
  ADC_P0  : -9.11245e-03 ± 2.47874e-02
  ADC_P1  : 8.43688e-03 ± 6.08364e-04
  ADC_P2  : -5.96505e-06 ± 2.96938e-06
  CSA_Chi2/NDF : 1.43978e-04 / 2
  CSA_P0  : 6.04144e-02 ± 8.00332e-03
  CSA_P1  : 1.00996e-02 ± 6.02992e-04
  CSA_P2  : -5.00464e-05 ± 9.18286e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  7
 | N_BROKEN_FAST :  [1, 18, 31, 83, 104, 116, 117]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  8
 | P_BROKEN_FAST :  [22, 70, 79, 81, 107, 109, 110, 126]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.1802', '1.800', '0.1745', '1.800', '0.0824', '7.000', '0.7071', 1, 1, 1, 1, 1724876836.41772]
VI_after__Init : ['1.201', '0.1803', '1.800', '0.1745', '1.800', '0.0768', '7.000', '0.7069', 1, 1, 1, 1, 1724876845.216024]
VI_at__the_End : ['1.201', '0.4949', '1.800', '0.1371', '1.799', '0.1130', '7.000', '0.7076', 1, 1, 1, 1, 1724876903.693589]