TEST_NAME : Wafer
TEST_DATE : 24_08_28-22_30_29
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-015-008-026-10 | FUSED_ID : 6359364768388645290
  IC_TEMP :  -52.46 | VDDM : 1123.58 | AUX_INT :   -9.48 | CsaBias :   68.84
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.53217e-03 / 2
  ADC_P0  : -9.47972e-03 ± 2.65881e-02
  ADC_P1  : 8.75071e-03 ± 6.91728e-04
  ADC_P2  : -5.43247e-06 ± 3.59589e-06
  CSA_Chi2/NDF : 1.71941e-04 / 2
  CSA_P0  : 5.79375e-02 ± 8.74605e-03
  CSA_P1  : 1.04857e-02 ± 6.58951e-04
  CSA_P2  : -5.51329e-05 ± 1.00350e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  8
 | N_BROKEN_FAST :  [11, 33, 35, 40, 60, 72, 88, 123]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [1, 2, 37, 49, 56, 121]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.1436', '1.800', '0.1780', '1.799', '0.0832', '7.000', '0.7079', 1, 1, 1, 1, 1724877029.7157884]
VI_after__Init : ['1.201', '0.1436', '1.800', '0.1781', '1.800', '0.0758', '7.000', '0.7069', 1, 1, 1, 1, 1724877037.7592616]
VI_at__the_End : ['1.201', '0.4961', '1.800', '0.1384', '1.800', '0.1105', '7.000', '0.7079', 1, 1, 1, 1, 1724877099.9454458]