TEST_NAME : Wafer
TEST_DATE : 24_08_28-22_32_05
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-015-008-027-10 | FUSED_ID : 6359364768388645306
  IC_TEMP :  -48.87 | VDDM : 1126.71 | AUX_INT :   -8.37 | CsaBias :   77.85
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.24914e-03 / 2
  ADC_P0  : -8.37282e-03 ± 2.39807e-02
  ADC_P1  : 8.67755e-03 ± 6.19495e-04
  ADC_P2  : -5.52119e-06 ± 3.18548e-06
  CSA_Chi2/NDF : 1.11337e-04 / 2
  CSA_P0  : 5.71058e-02 ± 7.03790e-03
  CSA_P1  : 9.63489e-03 ± 5.30255e-04
  CSA_P2  : -4.31585e-05 ± 8.07515e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  8
 | N_BROKEN_FAST :  [0, 6, 16, 60, 81, 94, 104, 109]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  7
 | P_BROKEN_FAST :  [0, 21, 27, 36, 106, 115, 127]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3099', '1.800', '0.1173', '1.800', '0.0855', '7.000', '0.7070', 1, 1, 1, 1, 1724877125.0445886]
VI_after__Init : ['1.201', '0.3100', '1.800', '0.1174', '1.800', '0.0797', '7.000', '0.7073', 1, 1, 1, 1, 1724877133.7389133]
VI_at__the_End : ['1.201', '0.4908', '1.800', '0.1359', '1.800', '0.1110', '7.000', '0.7080', 1, 1, 1, 1, 1724877186.0587618]