TEST_NAME : Wafer
TEST_DATE : 24_08_28-23_13_42
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-015-009-002-00 | FUSED_ID : 6359364768388648992
  IC_TEMP :  -59.39 | VDDM : 1125.72 | AUX_INT :   -7.14 | CsaBias :   61.40
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.02001e-03 / 2
  ADC_P0  : -7.13746e-03 ± 2.16392e-02
  ADC_P1  : 8.61384e-03 ± 5.53205e-04
  ADC_P2  : -5.85277e-06 ± 2.79774e-06
  CSA_Chi2/NDF : 1.70387e-04 / 2
  CSA_P0  : 5.78089e-02 ± 8.70644e-03
  CSA_P1  : 9.95055e-03 ± 6.55968e-04
  CSA_P2  : -4.93289e-05 ± 9.98961e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [23, 58, 60, 104, 124]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  9
 | P_BROKEN_FAST :  [3, 13, 17, 37, 44, 49, 59, 91, 104]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1013', '1.800', '0.1425', '1.800', '0.0787', '7.000', '0.7069', 1, 1, 1, 1, 1724879621.6601613]
VI_after__Init : ['1.201', '0.1013', '1.800', '0.1425', '1.800', '0.0730', '7.000', '0.7067', 1, 1, 1, 1, 1724879630.4454408]
VI_at__the_End : ['1.201', '0.4861', '1.800', '0.1410', '1.805', '0.1124', '7.000', '0.7078', 1, 1, 1, 1, 1724879684.1263247]