TEST_NAME : Wafer
TEST_DATE : 24_08_28-23_05_39
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-015-009-007-00 | FUSED_ID : 6359364768388649072
  IC_TEMP :  -50.31 | VDDM : 1131.95 | AUX_INT :   -8.92 | CsaBias :   71.74
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.38943e-03 / 2
  ADC_P0  : -8.91746e-03 ± 2.52841e-02
  ADC_P1  : 8.11708e-03 ± 6.04276e-04
  ADC_P2  : -5.15285e-06 ± 2.87350e-06
  CSA_Chi2/NDF : 1.11584e-04 / 2
  CSA_P0  : 5.79861e-02 ± 7.04568e-03
  CSA_P1  : 9.53981e-03 ± 5.30841e-04
  CSA_P2  : -4.15940e-05 ± 8.08409e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  4
 | N_BROKEN_FAST :  [7, 13, 29, 73]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  9
 | P_BROKEN_FAST :  [2, 9, 13, 19, 51, 72, 73, 88, 90]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2807', '1.800', '0.1578', '1.800', '0.0877', '7.000', '0.7068', 1, 1, 1, 1, 1724879139.4764261]
VI_after__Init : ['1.201', '0.2807', '1.800', '0.1579', '1.799', '0.0821', '7.000', '0.7069', 1, 1, 1, 1, 1724879147.6577296]
VI_at__the_End : ['1.201', '0.4903', '1.800', '0.1339', '1.805', '0.1118', '7.000', '0.7079', 1, 1, 1, 1, 1724879197.70787]