TEST_NAME : Wafer
TEST_DATE : 24_08_28-23_02_27
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-015-009-009-00 | FUSED_ID : 6359364768388649104
  IC_TEMP :  -53.32 | VDDM : 1131.21 | AUX_INT :   -8.64 | CsaBias :   67.49
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.23515e-03 / 2
  ADC_P0  : -8.64419e-03 ± 2.38446e-02
  ADC_P1  : 8.50569e-03 ± 6.04970e-04
  ADC_P2  : -5.11274e-06 ± 3.06367e-06
  CSA_Chi2/NDF : 1.48976e-04 / 2
  CSA_P0  : 6.21309e-02 ± 8.14104e-03
  CSA_P1  : 1.01419e-02 ± 6.13369e-04
  CSA_P2  : -5.24182e-05 ± 9.34088e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [9, 18, 23, 49, 51]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  10
 | P_BROKEN_FAST :  [12, 72, 78, 89, 90, 95, 96, 101, 113, 123]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1598', '1.800', '0.1706', '1.800', '0.0822', '7.000', '0.7071', 1, 1, 1, 1, 1724878947.1171877]
VI_after__Init : ['1.200', '0.1598', '1.800', '0.1705', '1.800', '0.0765', '7.000', '0.7071', 1, 1, 1, 1, 1724878955.2255943]
VI_at__the_End : ['1.201', '0.4887', '1.800', '0.1429', '1.804', '0.1125', '7.000', '0.7076', 1, 1, 1, 1, 1724879010.6972313]