TEST_NAME : Wafer
TEST_DATE : 24_08_28-22_59_14
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-015-009-011-00 | FUSED_ID : 6359364768388649136
  IC_TEMP :  -54.37 | VDDM : 1127.64 | AUX_INT :   -7.84 | CsaBias :   76.32
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 9.38382e-04 / 2
  ADC_P0  : -7.84041e-03 ± 2.07065e-02
  ADC_P1  : 8.47607e-03 ± 5.12487e-04
  ADC_P2  : -6.04151e-06 ± 2.51717e-06
  CSA_Chi2/NDF : 1.53418e-04 / 2
  CSA_P0  : 6.03711e-02 ± 8.26152e-03
  CSA_P1  : 9.89314e-03 ± 6.22446e-04
  CSA_P2  : -4.73408e-05 ± 9.47911e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  6
 | N_BROKEN_FAST :  [8, 38, 47, 83, 86, 115]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  4
 | P_BROKEN_FAST :  [2, 71, 89, 97]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.4113', '1.800', '0.1566', '1.800', '0.0929', '7.000', '0.7079', 1, 1, 1, 1, 1724878754.093102]
VI_after__Init : ['1.202', '0.4116', '1.800', '0.1565', '1.802', '0.0854', '7.000', '0.7072', 1, 1, 1, 1, 1724878762.9245083]
VI_at__the_End : ['1.202', '0.4920', '1.800', '0.1405', '1.800', '0.1113', '7.000', '0.7079', 1, 1, 1, 1, 1724878817.6011963]