TEST_NAME : Wafer
TEST_DATE : 24_08_28-22_52_55
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-015-009-015-00 | FUSED_ID : 6359364768388649200
  IC_TEMP :  -52.37 | VDDM : 1113.44 | AUX_INT :   -9.59 | CsaBias :   76.17
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.43453e-03 / 2
  ADC_P0  : -9.58565e-03 ± 2.56414e-02
  ADC_P1  : 8.64002e-03 ± 6.39024e-04
  ADC_P2  : -6.49349e-06 ± 3.16819e-06
  CSA_Chi2/NDF : 1.05030e-04 / 2
  CSA_P0  : 6.13943e-02 ± 6.83565e-03
  CSA_P1  : 9.66447e-03 ± 5.15017e-04
  CSA_P2  : -4.45284e-05 ± 7.84310e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [14, 19, 41, 53, 56]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  3
 | P_BROKEN_FAST :  [2, 64, 74]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1278', '1.800', '0.1798', '1.800', '0.0919', '7.000', '0.7084', 1, 1, 1, 1, 1724878374.693508]
VI_after__Init : ['1.202', '0.1278', '1.800', '0.1798', '1.800', '0.0848', '7.000', '0.7077', 1, 1, 1, 1, 1724878382.8169675]
VI_at__the_End : ['1.202', '0.4899', '1.800', '0.1414', '1.799', '0.1118', '7.000', '0.7082', 1, 1, 1, 1, 1724878445.3260922]