TEST_NAME : Wafer
TEST_DATE : 24_08_28-22_44_55
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-015-009-020-07 | FUSED_ID : 6359364768388649287
  IC_TEMP :  -56.05 | VDDM : 1111.59 | AUX_INT :   -7.98 | CsaBias :   85.02
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.10091e-03 / 2
  ADC_P0  : -7.97799e-03 ± 2.24556e-02
  ADC_P1  : 8.52167e-03 ± 5.58944e-04
  ADC_P2  : -6.16032e-06 ± 2.75572e-06
  CSA_Chi2/NDF : 1.05122e-04 / 2
  CSA_P0  : 6.31631e-02 ± 6.83864e-03
  CSA_P1  : 9.64995e-03 ± 5.15242e-04
  CSA_P2  : -4.45992e-05 ± 7.84653e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  6
 | N_BROKEN_FAST :  [4, 17, 28, 46, 58, 66]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  7
 | P_BROKEN_FAST :  [26, 47, 57, 100, 122, 124, 127]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3500', '1.800', '0.1711', '1.800', '0.0971', '7.000', '0.7086', 1, 1, 1, 1, 1724877894.5878975]
VI_after__Init : ['1.202', '0.3502', '1.800', '0.1713', '1.800', '0.0896', '7.000', '0.7074', 1, 1, 1, 1, 1724877902.722222]
VI_at__the_End : ['1.202', '0.4893', '1.800', '0.1392', '1.800', '0.1143', '7.000', '0.7083', 1, 1, 1, 1, 1724877965.4203608]