TEST_NAME : Wafer
TEST_DATE : 24_08_28-22_43_19
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-015-009-021-07 | FUSED_ID : 6359364768388649303
  IC_TEMP :  -55.43 | VDDM : 1138.16 | AUX_INT :   -3.70 | CsaBias :   65.43
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 4.15004e-04 / 2
  ADC_P0  : -3.70413e-03 ± 1.37473e-02
  ADC_P1  : 8.69196e-03 ± 3.57316e-04
  ADC_P2  : -6.28710e-06 ± 1.81834e-06
  CSA_Chi2/NDF : 1.34602e-04 / 2
  CSA_P0  : 6.04414e-02 ± 7.73834e-03
  CSA_P1  : 1.00869e-02 ± 5.83028e-04
  CSA_P2  : -4.86851e-05 ± 8.87883e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  6
 | N_BROKEN_FAST :  [1, 18, 79, 97, 100, 101]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  3
 | P_BROKEN_FAST :  [14, 26, 127]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2201', '1.800', '0.1822', '1.799', '0.0881', '7.000', '0.7084', 1, 1, 1, 1, 1724877798.441373]
VI_after__Init : ['1.202', '0.2202', '1.800', '0.1822', '1.800', '0.0803', '7.000', '0.7077', 1, 1, 1, 1, 1724877807.4166777]
VI_at__the_End : ['1.202', '0.5004', '1.800', '0.1423', '1.800', '0.1124', '7.000', '0.7083', 1, 1, 1, 1, 1724877861.7874036]