TEST_NAME : Wafer
TEST_DATE : 24_08_28-22_41_42
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-015-009-022-07 | FUSED_ID : 6359364768388649319
  IC_TEMP :  -57.05 | VDDM : 1128.76 | AUX_INT :   -8.08 | CsaBias :   77.99
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.09428e-03 / 2
  ADC_P0  : -8.08220e-03 ± 2.24028e-02
  ADC_P1  : 8.66791e-03 ± 5.71453e-04
  ADC_P2  : -6.03627e-06 ± 2.89289e-06
  CSA_Chi2/NDF : 1.37368e-04 / 2
  CSA_P0  : 6.29136e-02 ± 7.81744e-03
  CSA_P1  : 1.01683e-02 ± 5.88988e-04
  CSA_P2  : -5.04335e-05 ± 8.96959e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  6
 | N_BROKEN_FAST :  [19, 24, 78, 83, 98, 103]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  8
 | P_BROKEN_FAST :  [20, 26, 42, 49, 54, 56, 61, 103]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1617', '1.800', '0.1394', '1.800', '0.0859', '7.000', '0.7076', 1, 1, 1, 1, 1724877702.2369118]
VI_after__Init : ['1.202', '0.1617', '1.800', '0.1393', '1.799', '0.0802', '7.000', '0.7076', 1, 1, 1, 1, 1724877710.4531639]
VI_at__the_End : ['1.202', '0.4991', '1.800', '0.1423', '1.800', '0.1125', '7.000', '0.7083', 1, 1, 1, 1, 1724877768.5156803]