TEST_NAME : Wafer
TEST_DATE : 24_08_28-22_33_41
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-015-009-027-07 | FUSED_ID : 6359364768388649399
  IC_TEMP :  -55.72 | VDDM : 1126.96 | AUX_INT :   -7.54 | CsaBias :   75.13
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.03354e-03 / 2
  ADC_P0  : -7.54445e-03 ± 2.17669e-02
  ADC_P1  : 8.32387e-03 ± 5.33580e-04
  ADC_P2  : -5.65827e-06 ± 2.58998e-06
  CSA_Chi2/NDF : 1.10491e-04 / 2
  CSA_P0  : 5.73823e-02 ± 7.01110e-03
  CSA_P1  : 9.79347e-03 ± 5.28235e-04
  CSA_P2  : -4.51971e-05 ± 8.04440e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  3
 | N_BROKEN_FAST :  [54, 90, 105]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  10
 | P_BROKEN_FAST :  [11, 31, 37, 38, 41, 47, 74, 75, 76, 95]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2916', '1.800', '0.1491', '1.800', '0.0912', '7.000', '0.7072', 1, 1, 1, 1, 1724877220.9890018]
VI_after__Init : ['1.201', '0.2916', '1.800', '0.1492', '1.800', '0.0854', '7.000', '0.7072', 1, 1, 1, 1, 1724877229.8352606]
VI_at__the_End : ['1.201', '0.4913', '1.800', '0.1360', '1.800', '0.1114', '7.000', '0.7081', 1, 1, 1, 1, 1724877291.991324]