TEST_NAME : Wafer
TEST_DATE : 24_08_28-23_16_54
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-015-010-003-14 | FUSED_ID : 6359364768388653118
  IC_TEMP :  -56.18 | VDDM : 1127.09 | AUX_INT :   -9.55 | CsaBias :   66.66
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.82429e-03 / 2
  ADC_P0  : -9.54615e-03 ± 2.90064e-02
  ADC_P1  : 8.52074e-03 ± 7.22373e-04
  ADC_P2  : -5.98878e-06 ± 3.57255e-06
  CSA_Chi2/NDF : 1.55822e-04 / 2
  CSA_P0  : 5.91365e-02 ± 8.32600e-03
  CSA_P1  : 1.00355e-02 ± 6.27304e-04
  CSA_P2  : -4.96534e-05 ± 9.55310e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [8, 35, 59, 105, 122]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  11
 | P_BROKEN_FAST :  [4, 10, 29, 46, 53, 61, 71, 83, 90, 112, 122]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2256', '1.800', '0.1336', '1.800', '0.0877', '7.000', '0.7069', 1, 1, 1, 1, 1724879813.7644212]
VI_after__Init : ['1.198', '0.2257', '1.800', '0.1333', '1.800', '0.0821', '7.000', '0.7069', 1, 1, 1, 1, 1724879821.9937108]
VI_at__the_End : ['1.201', '0.4881', '1.800', '0.1372', '1.800', '0.1118', '7.000', '0.7076', 1, 1, 1, 1, 1724879876.0626013]