TEST_NAME : Wafer
TEST_DATE : 24_08_28-23_23_19
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-015-010-007-14 | FUSED_ID : 6359364768388653182
  IC_TEMP :  -52.82 | VDDM : 1125.75 | AUX_INT :   -9.35 | CsaBias :   74.39
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.35740e-03 / 2
  ADC_P0  : -9.34870e-03 ± 2.49609e-02
  ADC_P1  : 8.43103e-03 ± 6.14612e-04
  ADC_P2  : -5.75811e-06 ± 3.01678e-06
  CSA_Chi2/NDF : 1.35710e-04 / 2
  CSA_P0  : 5.84512e-02 ± 7.77012e-03
  CSA_P1  : 1.00770e-02 ± 5.85423e-04
  CSA_P2  : -5.06414e-05 ± 8.91529e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  3
 | N_BROKEN_FAST :  [17, 35, 54]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  8
 | P_BROKEN_FAST :  [2, 16, 38, 45, 77, 84, 93, 97]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1707', '1.800', '0.1224', '1.800', '0.0831', '7.000', '0.7080', 1, 1, 1, 1, 1724880198.4637113]
VI_after__Init : ['1.201', '0.1707', '1.800', '0.1222', '1.799', '0.0754', '7.000', '0.7072', 1, 1, 1, 1, 1724880207.318117]
VI_at__the_End : ['1.201', '0.4899', '1.800', '0.1374', '1.802', '0.1107', '7.000', '0.7079', 1, 1, 1, 1, 1724880267.4403934]