TEST_NAME : Wafer
TEST_DATE : 24_08_28-23_32_55
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-015-010-013-14 | FUSED_ID : 6359364768388653278
  IC_TEMP :  -55.20 | VDDM : 1131.66 | AUX_INT :   -8.95 | CsaBias :   68.01
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.37018e-03 / 2
  ADC_P0  : -8.94521e-03 ± 2.50710e-02
  ADC_P1  : 8.60868e-03 ± 6.26230e-04
  ADC_P2  : -6.40008e-06 ± 3.10200e-06
  CSA_Chi2/NDF : 1.13232e-04 / 2
  CSA_P0  : 5.83907e-02 ± 7.09752e-03
  CSA_P1  : 1.01710e-02 ± 5.34747e-04
  CSA_P2  : -5.20509e-05 ± 8.14356e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  8
 | N_BROKEN_FAST :  [7, 24, 37, 73, 76, 77, 88, 121]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  3
 | P_BROKEN_FAST :  [50, 85, 114]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.4536', '1.800', '0.1457', '1.799', '0.1014', '7.000', '0.7084', 1, 1, 1, 1, 1724880775.0342212]
VI_after__Init : ['1.201', '0.4539', '1.800', '0.1458', '1.800', '0.0939', '7.000', '0.7076', 1, 1, 1, 1, 1724880783.2195258]
VI_at__the_End : ['1.201', '0.4887', '1.800', '0.1392', '1.804', '0.1110', '7.000', '0.7083', 1, 1, 1, 1, 1724880849.2754838]